Automatic Test Equipment: Boundary Scan, Mixed-Signal, In-Circuit Test

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Board Tester Spare Part
ATE Equipment (IMS Vanguard)
AOI
AOI INSPECTION
Test Equipment in Near Refurbished Condition
Agilent 86145B Optical Spectrum Analyzer
GenRad TS87 In-Circuit Test System - Near Refurbished Condition
Teradyne Spectrum 8852 - Near Refurbished Condition
SPEA 4040 Flying Probe
Nicolet NXR 1400 X-Ray Machine


Circuit Board Test
	ASSET�s two new ScanWorks controller kits tap into high-speed PCI Express bus -- New PCIe-1000 and PCIe-410 are platform controllers supporting ScanWorks validation, test and debug tools
	Teradyne and Corelis Announce Agreement to Bolster Boundary-Scan In-Circuit Test Capability
	ASSET�s board bring-up solution first to validate, test and debug designs using the Intel microarchitecture codenamed Haswell
Semiconductor Test
	Roos Instruments Ships 40 GHz and 77 GHz ATE for HVM
	LTX Announces Silicon Image Selects Fusion
	Symtx joins VXI Technology, National Instruments, Teradyne and Agilent Technologies in VXI Seminar Tour

Delay Fault Testing for VLSI Circuits

Delay testing has been a topic of extensive research both in industry and in academia for more than a decade. As a result, several delay fault models .... (more)


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