Automatic Test Equipment: Boundary Scan, Mixed-Signal, In-Circuit Test

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Agilent 5DX Series 3
Agilent 5DX Series 5000
Agilent 5DX Series 5000
Teradyne ICT System 1890
Teradyne ICT System 1888-2
Teradyne ICT System 1860
Teradyne / GenRad ICT System 2284
Teradyne/ GenRad ICT System 2283
Teradyne / GenRad ICT System 2287


Circuit Board Test
	ASSET commits to developing open embedded instrument tools for the Internal JTAG (IJTAG) standard -- Two experts join ASSET to put development effort on a fast track
	TRI integrates ASSET��s ScanWorks� boundary-scan technology into its test systems
	JTAG Technologies � more focus on Russia with brand new Russian website and show activities at ExpoElectronica 2008
Semiconductor Test
	LTX Announces Silicon Image Selects Fusion
	Symtx joins VXI Technology, National Instruments, Teradyne and Agilent Technologies in VXI Seminar Tour
	LTX Announces RF Micro Devices Deploys Fusion for Volume Testing

Analog and Mixed-Signal Boundary-Scan

The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Std. 1149.1, commonly known as JTAG. This new..... (more)


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An information resource for Automatic Test Equipment users