Instruments Ships 40 GHz and 77 GHz ATE for HVM
Instruments, Inc. of Santa Clara, CA, is now shipping the world's first
77 GHz integrated high speed ATE solution in the form of two mm-wave
Tester Instrument Modules (TIMs) for both its Cassini Test platform and
its RI7100C Test platform. The solution extends the general purpose
coverage of either test platform to 40 GHz and provides banded source
and vector measurements up to 110 GHz.
Mark Roos, CEO, stated,
"While there has been some interest in past years in frequencies above
20 GHz, the recent advances in process technology combined with the
imminent high volume applications in automotive radar and multimedia
communications have accelerated the need for a HVM test solution. RI's
expertise in this area combined with its configurable HVM platforms
enable us to offer a truly production ready solution."
20-40 GHz Module is a single slot TIM that extends general tester
coverage from 20 GHz to 40 GHz. Each TIM provides a source/receive port
plus a receive only port. Source power up to +5 dBm with 30 dB of
dynamic range is standard. Measurement capability includes up to 90 dB
of dynamic range. A single Cassini or RI7100C platform supports multiple
40 GHz TIMs to extend the number of available ports. Primary
applications at this time are for short range automotive radar used for
steering assistance and back-up obstacle detection.
77 GHz Module is a single slot TIM that extends the coverage of the
RI8563A to 75-78 GHz, focused primarily on automotive collision
avoidance radar. Similar TIMs are available over bands ranging from 50
GHz to 110 GHz. This family of TIMs will provide low cost, high speed
production test for applications such as 1 GB/s PANs, Wireless
TV/Camcorder connections, embedded automotive monitoring, Wireless LCD
monitors and many other point to point communications applications. The
RI8564A is a single port TIM that can source or measure up to +10 dBm.
In receive mode, there is over 90 dB of dynamic measurement range
RI is currently accepting orders for either platform
including both modules which are priced competitively with benchtop
instrumentation. Fixture solutions are available for probe and final
test. Please visit us at the International Test Conference, Exhibit 103
in Santa Clara, Oct. 28 - Oct. 30, 2008. RI and Cascade Micro will be
jointly hosting a seminar showing a turnkey production test solution
during Semicon Japan. For more information, contact firstname.lastname@example.org.