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Date: 09-10-2009

Title: Corelis Broadens Processor Support for Functional Test

Comment:

For Immediate Release

 

Contact:

Ryan Jones

Senior Technical Marketing Engineer

Tel.: +1 562-926-6727

Fax: +1 562-404-6196

Email: ryan.jones@corelis.com

 

Corelis Broadens Processor Support for Functional Test

Freescale, Intel, and others join the ScanExpress JET processor library list.

Jump to processor support page


Cerritos, CA, September 10, 2009
– Corelis recently reached a milestone in processor functional test support by breaking the 1,000 processor barrier in its ScanExpress JTAG Embedded Test (JET) library. The company announced that key processors families such as Freescale Power Architecture and Intel Atom are now available. A complete listing of processor support is available on the Corelis website.

ScanExpress JET is a functional test pattern generator, debugger, tester and exerciser tool for microprocessors with on-chip debug features accessible through their JTAG port. The tool can be used as a stand-alone functional test station or in conjunction with traditional boundary-scan test techniques. This means that sound structural tests for opens and shorts can be performed via boundary-scan while at-speed functional testing can be performed using the CPU to run test programs loaded into memory. ScanExpress JET can even run functional tests and diagnose faulty boards even when the embedded CPU is not able to boot and the board self test is not operational.

Ryan Jones, Senior Technical Marketing Engineer at Corelis, states “When ScanExpress JET was first announced at the ITC conference in 2006, we naturally included processor architecture support from our emulation line of products that we had developed over the last two decades, such as PowerPC®, ARM®, and MIPS®. Since that time, we have worked vigorously with key microprocessor manufacturers to ensure the JET product has the latest, most popular processor technology available. As the continuously growing list nears 1,100 processors, Corelis is clearly paving the road for embedded functional testing through the JTAG port.”

“Embedded functional testing is a key component in the growth of Corelis,” says George B. La Fever, CEO and President at Corelis. “We have put significant effort towards the expansion of functional test processor support for our JTAG Embedded Test product line. Our core competency in developing boundary-scan and emulation products allows us to add reliable processor support with minimal risk and turn-around time. The ability for us to continually deepen our processor library at such an aggressive pace clearly differentiates Corelis from other solutions.”

About Corelis

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